Phys.org -
6 Feb 2015 15:00

A team of researchers with the University of California has found a way to use a transmission electron microscope (TEM) as a thermometer for measuring heat in micro-electric devices. In their paper published in the journal Science, the team describes how they discovered using a TEM on a tiny piece of metal could reveal its density change as electrons passed through. Christian Colliex with the L'Université de Paris, offers a Perspective piece on the work by the team in the same journal edition.
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