Phys.org -
7 Jun 2016 23:42

Researchers at the Paul Scherrer Institute's Swiss Light Source in Villigen, Switzerland, have developed a new design for X-ray spectrometers that eschews a commonly utilized component to lowers overall production costs and increase the efficiency of x-ray flux, which may lead to faster acquisition times for sample imaging and increased efficiency for the system. This is essential for biological samples which may be damaged by continued x-ray exposure.
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