How the smallest damage at the surface of semiconductor crystals develops into large defects

Using non-destructive imaging methods, a team of scientists at KIT obtains three-dimensional insights into the interior of crystals. They determine important data about line-shaped defects that largely influence the deformation behavior of crystals. These so-called dislocations impede the production of computer chips. As reported in the Physical Review Letters, the scientists combine two X-ray methods with a special type of light microscopy.