A new technique to maximize scan diagnosis throughput

by Jayant D'Souza, product manager Tessent group at Mentor, a Siemens Business Charged with the task of improving yield, product engineers need to find the location of defects in manufactured ICs quickly and efficiently. Typically, they use failing test cycles to perform scan diagnosis, which is then analyzed to reveal the location and root cause […] The post A new technique to maximize scan diagnosis throughput appeared first on Electrical Engineering News and Products.