Sign In
to Vote &
Create Storyboards.
 
A scattering-type scanning nearfield optical microscope probes materials at the nanoscale An MIT physicist has built a new instrument of interest to MIT researchers across a wide range of disciplines because it can quickly and relatively inexpensively determine a variety of important characteristics of a material at the nanoscale. It's capable of not only determining internal properties of a material, such as how that material's electrical or optical conductivity changes over exquisitely short distances, but also visualizing individual molecules, like proteins.
1
0
0


Storyboard
Print
Share this Article

Recommended

  • {TITLE}
    {PUBLISHER} - {PUBLISHED_DATE}
    {VIEWS}
  • Create Storyboard